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ICPR
2006
IEEE
16 years 7 months ago
Pores and Ridges: Fingerprint Matching Using Level 3 Features
Fingerprint friction ridge details are generally described in a hierarchical order at three levels, namely, Level 1 (pattern), Level 2 (minutiae points) and Level 3 (pores and rid...
Anil K. Jain, Meltem Demirkus, Yi Chen
ICPR
2004
IEEE
16 years 7 months ago
Laser Stripe Peak Detector for 3D Scanners. A FIR Filter Approach
The accuracy of a 3D reconstruction using laser scanners is significantly determined by the detection of the laser stripe. Since the energy pattern of such a stripe corresponds to...
Carles Pous, Enric Cabruja, Joaquim Salvi, Josep F...
ICPR
2000
IEEE
16 years 7 months ago
Attributed Tree Homomorphism Using Association Graphs
The matching of hierarchical relational structures is of significant interest in computer vision and pattern recognition. We have recently introduced a new solution to this proble...
Massimo Bartoli, Marcello Pelillo, Kaleem Siddiqi,...
DAC
2008
ACM
16 years 7 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2007
ACM
16 years 7 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...