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ITC
1999
IEEE
78views Hardware» more  ITC 1999»
15 years 10 months ago
Minimized power consumption for scan-based BIST
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
Stefan Gerstendörfer, Hans-Joachim Wunderlich
ITC
1999
IEEE
118views Hardware» more  ITC 1999»
15 years 10 months ago
Logic BIST for large industrial designs: real issues and case studies
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
Graham Hetherington, Tony Fryars, Nagesh Tamarapal...
ICNP
1998
IEEE
15 years 10 months ago
Evaluating the Overheads of Source-Directed Quality-of-Service Routing
Quality-of-service (QoS) routing satisfiesapplication performance requirements and optimizes network resource usage but effective path-selection schemes require the distribution o...
Anees Shaikh, Jennifer Rexford, Kang G. Shin
GCB
1997
Springer
77views Biometrics» more  GCB 1997»
15 years 10 months ago
Statistics of large scale sequence searching
Motivation: Database search programs such as FASTA, BLAST or a rigorous Smith–Waterman algorithm produce lists of database entries, which are assumed to be related to the query....
Rainer Spang, Martin Vingron
ICTAI
1993
IEEE
15 years 10 months ago
Robust Feature Selection Algorithms
Selecting a set of features which is optimal for a given task is a problem which plays an important role in a wide variety of contexts including pattern recognition, adaptive cont...
Haleh Vafaie, Kenneth DeJong