Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no wo...
Mark Harman, Fayezin Islam, Tao Xie, Stefan Wapple...
Glitches (spurious transitions) are common in electronic circuits. In this paper we present a novel approach to reduce dynamic power in FPGAs by reducing glitches during the routi...
Long queries frequently contain many extraneous terms that hinder retrieval of relevant documents. We present techniques to reduce long queries to more effective shorter ones tha...
Leakage power is one of the most critical issues for ultra-deep submicron technology. Subthreshold leakage depends exponentially on linewidth, and consequently variation in linewi...
Gate oxide tunneling current Igate and sub-threshold current Isub dominate the leakage of designs. The latter depends on threshold voltage Vth while Igate vary with the thickness ...