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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 6 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
NAACL
2003
15 years 7 months ago
Semantic Language Models for Topic Detection and Tracking
In this work, we present a new semantic language modeling approach to model news stories in the Topic Detection and Tracking (TDT) task. In the new approach, we build a unigram la...
Ramesh Nallapati
NDSS
2005
IEEE
15 years 11 months ago
One-Way Isolation: An Effective Approach for Realizing Safe Execution Environments
In this paper, we present an approach for realizing a safe execution environment (SEE) that enables users to “try out” new software (or configuration changes to existing soft...
Weiqing Sun, Zhenkai Liang, V. N. Venkatakrishnan,...
NDSS
2008
IEEE
16 years 17 days ago
Automated Whitebox Fuzz Testing
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
Patrice Godefroid, Michael Y. Levin, David A. Moln...
DFT
1997
IEEE
93views VLSI» more  DFT 1997»
15 years 10 months ago
An IDDQ Sensor for Concurrent Timing Error Detection
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
Christopher G. Knight, Adit D. Singh, Victor P. Ne...