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ISSRE
2008
IEEE
16 years 11 days ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
EUROMICRO
2005
IEEE
15 years 11 months ago
Improvement of Design Specifications with Inspection and Testing
Dietmar Winkler, Bernhard Riedl, Stefan Biffl
FATES
2005
Springer
15 years 11 months ago
Play to Test
Andreas Blass, Yuri Gurevich, Lev Nachmanson, Marg...