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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 11 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
IDA
1999
Springer
15 years 11 months ago
Reasoning about Input-Output Modeling of Dynamical Systems
The goal of input-output modeling is to apply a test input to a system, analyze the results, and learn something useful from the causeeffect pair. Any automated modeling tool that...
Matthew Easley, Elizabeth Bradley
SCALESPACE
1999
Springer
15 years 11 months ago
Morphing Active Contours
ÐA method for deforming curves in a given image to a desired position in a second image is introduced in this paper. The algorithm is based on deforming the first image toward the...
Marcelo Bertalmío, Guillermo Sapiro, Gregor...
MICRO
1993
IEEE
127views Hardware» more  MICRO 1993»
15 years 11 months ago
An extended classification of inter-instruction dependency and its application in automatic synthesis of pipelined processors
The conventional classification of inter-instruction dependencies (data, anti and output dependencies) provides a basic scheme for the analysis of pipeline hazards in pipelined in...
Ing-Jer Huang, Alvin M. Despain
DAC
2007
ACM
15 years 10 months ago
Side-Channel Attack Pitfalls
While cryptographic algorithms are usually strong against mathematical attacks, their practical implementation, both in software and in hardware, opens the door to side-channel at...
Kris Tiri