3082 search results - page 278 / 617 » Deviation Analysis: A New Use of Model Checking |
175
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IJCV
2000
15 years 6 months ago
2000
Abstract. We describe a novel automatic technique for finding a dense correspondence between a pair of n-dimensional surfaces with arbitrary topologies. This method employs a diffe...
182
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ACCV
1998
Springer
15 years 10 months ago
1998
Springer
One of the important problems related to image analysis and compression is finding repeated structure. Although the focus of this paper is developing digital geometric models and m...
171
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DATE
2006
IEEE
16 years 19 days ago
2006
IEEE
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
154
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WWW
2009
ACM
16 years 7 months ago
2009
ACM
This paper presents SOFIE, a system for automated ontology extension. SOFIE can parse natural language documents, extract ontological facts from them and link the facts into an on...
145
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IEEEPACT
2007
IEEE
16 years 27 days ago
2007
IEEE
The process of verifying a new microprocessor is a major problem for the computer industry. Currently, architects design processors to be fast, power-efficient, and reliable. Howe...