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ICCAD
2005
IEEE
176views Hardware» more  ICCAD 2005»
16 years 3 months ago
Statistical gate sizing for timing yield optimization
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
Debjit Sinha, Narendra V. Shenoy, Hai Zhou
CISIS
2009
IEEE
16 years 1 months ago
SAMOA - A Semi-Automated Ontology Alignment Method for Systems Integration in Safety-Critical Environments
The integration of heterogeneous data sources with even heterogeneous semantic meanings poses a challenge for data and system integrators. Ontology Alignment (OA) tries to identif...
Thomas Moser, Kathrin Schimper, Richard Mordinyi, ...
CDC
2008
IEEE
152views Control Systems» more  CDC 2008»
16 years 1 months ago
Non-uniform small-gain theorems for systems with unstable invariant sets
— We consider the problem of small-gain analysis of asymptotic behavior in interconnected nonlinear dynamic systems. Mathematical models of these systems are allowed to be uncert...
Ivan Tyukin, Erik Steur, Henk Nijmeijer, Cees van ...
KBSE
2008
IEEE
16 years 1 months ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
CEC
2007
IEEE
16 years 1 months ago
Estimation of distribution algorithms for testing object oriented software
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
Ramón Sagarna, Andrea Arcuri, Xin Yao
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