4340 search results - page 338 / 868 » Designing for change |
152
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post...
171
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
191
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ACMDIS
2010
ACM
15 years 7 months ago
2010
ACM
Recent convergence between low-cost technology, artform and political discourse presents a new design space for enabling public participation and expression. We explore non-expert...
211
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ISCI
2008
15 years 6 months ago
2008
Most modern cryptographic studies design cryptosystems and algorithms using mathematical concepts. In designing and analyzing cryptosystems and protocols, mathematical concepts ar...
204
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MTDT
2003
IEEE
16 years 1 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...