4454 search results - page 506 / 891 » Designing components for e-services |
177
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JCP
2008
15 years 6 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
133
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TCAD
2008
15 years 6 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
203
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TCAD
2008
15 years 6 months ago
2008
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
179
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JIRS
2007
15 years 6 months ago
2007
This paper presents a methodology for the realization of intelligent, task-based reconfiguration of the computational hardware for mobile robot applications. Task requirements are ...
172
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VLSISP
2008
15 years 6 months ago
2008
The compiler is generally regarded as the most important software component that supports a processor design to achieve success. This paper describes our application of the open re...