Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...
Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,...
Increasing miniaturization is posing multiple challenges to electronic designers. In the context of Multi-Processor System-onChips (MPSoCs), we focus on the problem of implementin...
Federico Angiolini, Paolo Meloni, Salvatore Carta,...
Improvements in semiconductor technology have made it possible to include multiple processor cores on a single die. Chip Multi-Processors (CMP) are an attractive choice for future...
Many embedded systems are designed to take timely reactions to the occurrences of interested scenarios. Sometimes transient overloads might be experienced due to hardware malfunct...
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...