4394 search results - page 596 / 879 » Designing agent chips |
201
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
166
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
157
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ACSAC
2008
IEEE
16 years 1 months ago
2008
IEEE
Main memory contains transient information for all resident applications. However, if memory chip contents survives power-off, e.g., via freezing DRAM chips, sensitive data such a...
165
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IEEEPACT
2008
IEEE
16 years 29 days ago
2008
IEEE
This paper presents the Distributed Cooperative Caching, a scalable and energy-efficient scheme to manage chip multiprocessor (CMP) cache resources. The proposed configuration is...
166
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MICRO
2007
IEEE
16 years 25 days ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...