4394 search results - page 585 / 879 » Designing agent chips |
161
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DDECS
2007
IEEE
16 years 27 days ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
160
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DDECS
2007
IEEE
16 years 27 days ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
159
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GLOBECOM
2007
IEEE
16 years 27 days ago
2007
IEEE
— In this paper, we propose a novel channel sounding technique, called the multicarrier direct sequence swept time delay cross-correlation (MC-DS-STDCC), which is designed to min...
141
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VTC
2007
IEEE
16 years 25 days ago
2007
IEEE
—In this contribution we propose and investigate a transmitter preprocessing scheme designed for downlink transmission in multicarrier direct-sequence code-division multiple-acce...
166
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VTS
2007
IEEE
16 years 25 days ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...