Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
Franco Stellari, Peilin Song, Moyra K. McManus, Ro...
In this paper we present a review of recent advances in the field of ultra-sensitive imagers with ultra fast detection capability. Photon counting capability in these sensors is ge...
We propose a circuit performance oriented device optimization methodology using pre-silicon parameters and critical paths which represent the performance of the chip. Based on our...
Continuing improvements in semiconductor fabrication density are enabling new classes of System-on-aChip architectures that combine extensive processing logic and high-density mem...
Luke Roth, Lee D. Coraor, David L. Landis, Paul T....
For a logic design with level-sensitive latches, we need to validate timing signal paths which may flush through several latches. We developed efficient algorithms based on the mo...