16822 search results - page 3115 / 3365 » Designing Simulation Experiments |
166
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
159
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DSD
2009
IEEE
16 years 1 months ago
2009
IEEE
—The scalability and performance of the Internet depends critically on the performance of its packet switches. Current packet switches are based on single-hop crossbar fabrics, w...
197
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DSN
2009
IEEE
16 years 1 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
182
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GLOBECOM
2009
IEEE
16 years 1 months ago
2009
IEEE
—One of the key factors underlying the popularity of Low-density parity-check (LDPC) code is its iterative decoding algorithm that is amenable to efficient hardware implementati...
173
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HPDC
2009
IEEE
16 years 1 months ago
2009
IEEE
Since the advent of electronic computing, the processors’ clock speed has risen tremendously. Now that energy efficiency requirements have stopped that trend, the number of proc...