2918 search results - page 396 / 584 » Design tools for reliability analysis |
176
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LCTRTS
2010
Springer
15 years 11 months ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
167
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ASPLOS
2006
ACM
16 years 13 days ago
2006
ACM
While the number of transistors on a chip increases exponentially over time, the productivity that can be realized from these systems has not kept pace. To deal with the complexit...
181
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
synchronisation also play a fundamental role in overall system robustness. ElectroMagnetic Compatibility (EMC) and ElectroMagnetic Interference (EMI) issues also have to be conside...
203
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ICCV
2001
IEEE
16 years 8 months ago
2001
IEEE
We present two solutions for the scale selection problem in computer vision. The rst one is completely nonparametric and is based on the the adaptive estimation of the normalized ...
169
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ICCS
1997
Springer
15 years 10 months ago
1997
Springer
: The need for analysis and modeling of knowledge has been espoused by many researchers as a prerequisite to building knowledge based systems (KBS). This approach has done little t...