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161
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
191
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EVOW
2001
Springer
15 years 11 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
160
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BCS
2008
15 years 8 months ago
2008
Using formal verification for designing hardware designs free from logic design bugs has been an active area of research since the last 15 years. Technology has matured and we hav...
184
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SAMOS
2004
Springer
15 years 11 months ago
2004
Springer
In recent years, power consumption has become a critical concern for many VLSI systems. Whereas several case studies demonstrate that technology-, layout-, and gate-level technique...
162
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CHI
2005
ACM
16 years 6 months ago
2005
ACM
This paper describes a new collaboration technology that is based on the support of lightweight, informally structured, opportunistic activities featuring heterogeneous threads of...