1251 search results - page 156 / 251 » Design of an Early Minicomputer |
187
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DATE
2008
IEEE
16 years 25 days ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
181
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VLSID
2008
IEEE
16 years 22 days ago
2008
IEEE
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
158
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ICDIM
2007
IEEE
16 years 21 days ago
2007
IEEE
It becomes clear for manufacturing companies that product lifecycle cost (LCC) is as crucial as product quality and functionality in deciding the success of a product in the marke...
184
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ICECCS
2007
IEEE
16 years 21 days ago
2007
IEEE
Identifying and resolving design problems in the early design phase can help ensure software quality and save costs. There are currently few tools for analyzing designs expressed ...
182
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RTCSA
2007
IEEE
16 years 19 days ago
2007
IEEE
— To use the tremendous hardware resources available in next generation MultiProcessor Systems-on-Chip (MPSoC) efficiently, rapid and accurate design space exploration (DSE) met...