305 search results - page 50 / 61 » Design of Digital Circuits on the Basis of Hardware Template... |
151
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DDECS
2007
IEEE
16 years 11 days ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
178
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MTDT
2003
IEEE
15 years 11 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
145
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DATE
2007
IEEE
16 years 11 days ago
2007
IEEE
The ability to guarantee the functional correctness of digital integrated circuits and, in particular, complex microprocessors, is a key task in the production of secure and trust...
171
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EH
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper presents experimental results of fast intrinsic evolutionary design and evolutionary fault recovery of a 4-bit Digital to Analog Converter (DAC) using the JPL stand-alo...
182
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FPGA
2005
ACM
15 years 11 months ago
2005
ACM
Floating-point Sparse Matrix-Vector Multiplication (SpMXV) is a key computational kernel in scientific and engineering applications. The poor data locality of sparse matrices sig...