The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
A stochastic global optimization approach is presented for transistor sizing in CMOS VLSI circuits. This is a direct search strategy for the best design among feasible ones, with ...
: In this paper, we propose a methodology based on genetic programming to automatically generate hardware designs of substitution boxes necessary for many cryptosystems such as DES...