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DATE
2003
IEEE
108views Hardware» more  DATE 2003»
15 years 11 months ago
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
HIPEAC
2005
Springer
15 years 11 months ago
Induction Variable Analysis with Delayed Abstractions
ions Sebastian Pop 1 , Albert Cohen 2 , and Georges-Andr´e Silber 1 1 CRI, Mines Paris, Fontainebleau, France 2 ALCHEMY group, INRIA Futurs, Orsay, France Abstract. This paper pre...
Sebastian Pop, Albert Cohen, Georges-André ...

Book
301views
17 years 4 months ago
Programming in Standard ML
"Standard ML is a type-safe programming language that embodies many innovative ideas in programming language design. It is a statically typed language, with an extensible type...
Robert Harper
ECOOP
2000
Springer
15 years 10 months ago
Generic Wrappers
Abstract. Component software means reuse and separate marketing of pre-manufactured binary components. This requires components from different vendors to be composed very late, pos...
Martin Büchi, Wolfgang Weck
GPCE
2005
Springer
15 years 11 months ago
Applying a Generative Technique for Enhanced Genericity and Maintainability on the J2EE Platform
One of the themes in building reusable and maintainable software is identifying similarities and designing generic solutions to unify similarity patterns. In this paper, we analyze...
Yang Jun, Stan Jarzabek