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133
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ISQED
2007
IEEE
16 years 7 days ago
2007
IEEE
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
170
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DAC
1999
ACM
15 years 10 months ago
1999
ACM
We present a methodology for the watermarking of synchronous sequential circuits that makes it possible to identify the authorship of designs by imposing a digital watermark on th...
195
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ISQED
2006
IEEE
15 years 12 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
150
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DSD
2010
IEEE
15 years 6 months ago
2010
IEEE
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...