Designer's productivity has become the key-factor of the development of electronic systems. An increasing application of design data reuse is widely recognized as a promising...
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
In this paper, a temperature-to-frequency transducer suitable for thermal monitoring on FPGAs is presented. The dependence between delay and temperature is used to produce a freque...
d Abstract) Alexander Aiken1 and Edward L. Wimmers2 and Jens Palsberg3 1 EECS Department, University of California at Berkeley, Berkeley, CA 94720-1776. 2 IBM Almaden Research Cent...
Verification Condition Generator (VCG) tools have been effective in simplifying the task of proving programs correct. However, in the past these VCG tools have in general not thems...