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» Defect Tolerance in Multiple-FPGA Systems
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172
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MICRO
2009
IEEE
178views Hardware» more  MICRO 2009»
16 years 13 days ago
Improving cache lifetime reliability at ultra-low voltages
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
Zeshan Chishti, Alaa R. Alameldeen, Chris Wilkerso...
173
Voted
TVLSI
2010
15 years 15 days ago
Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM Coding
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
Shu Li, Tong Zhang
ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
16 years 13 days ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...
189
Voted
DAC
2003
ACM
16 years 6 months ago
A survey of techniques for energy efficient on-chip communication
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
Vijay Raghunathan, Mani B. Srivastava, Rajesh K. G...
HPCA
2006
IEEE
16 years 6 months ago
BulletProof: a defect-tolerant CMP switch architecture
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...