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170
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
179
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
Efficient architecture exploration and design of application specific instruction-set processors (ASIPs) requires retargetable software development tools, in particular C compil...
197
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
177
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
In the RESUME project we explore the use of reconfigurable hardware for the design of portable multimedia systems by developing a scalable wavelet-based video codec. A scalable v...
158
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
Current Systems-On-Chip (SoC) execute applications that demand extensive parallel processing. Networks-OnChip (NoC) provide a structured way of realizing interconnections on silic...