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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
16 years 1 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
KBSE
2007
IEEE
16 years 1 months ago
Evacon: a framework for integrating evolutionary and concolic testing for object-oriented programs
Achieving high structural coverage such as branch coverage in objectoriented programs is an important and yet challenging goal due to two main challenges. First, some branches inv...
Kobi Inkumsah, Tao Xie
GRID
2007
Springer
16 years 1 months ago
CIC portal: a collaborative and scalable integration platform for high availability grid operations
— EGEE, along with its sister project LCG, manages the world’s largest Grid production infrastructure which is spreading nowadays over 260 sites in more than 40 countries. Just...
Osman Aidel, Alessandro Cavalli, Hélè...
SAC
2004
ACM
16 years 7 days ago
Integrating similarity-based queries in image DBMSs
Until recently, issues in image retrieval have been handled in DBMSs and in computer vision as separate research works. Nowadays, the trend is towards integrating the two approach...
Solomon Atnafu, Richard Chbeir, David Coquil, Lion...
DAGM
2003
Springer
16 years 1 days ago
A Computational Model of Early Auditory-Visual Integration
We introduce a computational model of sensor fusion based on the topographic representations of a ”two-microphone and one camera” configuration. Our aim is to perform a robust...
Carsten Schauer, Horst-Michael Gross