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ITC
1996
IEEE
114views Hardware» more  ITC 1996»
15 years 10 months ago
A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
ADBIS
2007
Springer
127views Database» more  ADBIS 2007»
16 years 21 days ago
Approximate Functional Dependencies for XML Data
Functional dependencies (FDs) are an integral part of database theory since they are used in integrity enforcement and in database design. Recently, functional dependencies satis...
Fabio Fassetti, Bettina Fazzinga
ADC
2009
Springer
134views Database» more  ADC 2009»
16 years 1 months ago
Mobile Information Exchange and Integration: From Query to Application Layer
Due to the popularity of mobile devices, more and more commercial applications have been developed on these devices. While commercial applications are mostly backed by relational ...
Van T. K. Tran, Raymond K. Wong, William K. Cheung...
ACSAC
2003
IEEE
15 years 11 months ago
Automated Analysis for Digital Forensic Science: Semantic Integrity Checking
When computer security violations are detected, computer forensic analysts attempting to determine the relevant causes and effects are forced to perform the tedious tasks of find...
Tye Stallard, Karl N. Levitt
DATE
2003
IEEE
92views Hardware» more  DATE 2003»
15 years 11 months ago
An Integrated Approach for Improving Cache Behavior
The widening gap between processor and memory speeds renders data locality optimization a very important issue in data-intensive embedded applications. Throughout the years hardwa...
Gokhan Memik, Mahmut T. Kandemir, Alok N. Choudhar...