1327 search results - page 122 / 266 » Data Dependent Circuit Design: A Case Study |
148
click to vote
VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
140
click to vote
CSREAESA
2004
15 years 7 months ago
2004
Adders are some of the most critical data path circuits requiring considerable design effort in order to "squeeze" out as much performance gain as possible. Many adder d...
157
click to vote
KBSE
2008
IEEE
16 years 20 days ago
2008
IEEE
In agile software development, test code can considerably contribute to the overall source code size. Being a valuable asset both in terms of verification and documentation, the ...
190
click to vote
CSE
2009
IEEE
16 years 1 months ago
2009
IEEE
—In this paper we present a design methodology for the identification and development of a suitable hardware platform (including dedicated hardware accelerators) for the data pl...
145
click to vote
ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...