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» DRAM Specific Approximation of the Faulty Behavior of Cell D...
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ATS
2002
IEEE
75views Hardware» more  ATS 2002»
16 years 7 days ago
DRAM Specific Approximation of the Faulty Behavior of Cell Defects
Zaid Al-Ars, A. J. van de Goor
ATS
2005
IEEE
56views Hardware» more  ATS 2005»
16 years 27 days ago
Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
Zaid Al-Ars, Said Hamdioui, Jörg E. Vollrath
VTS
2002
IEEE
124views Hardware» more  VTS 2002»
16 years 5 days ago
Approximating Infinite Dynamic Behavior for DRAM Cell Defects
Zaid Al-Ars, A. J. van de Goor