2129 search results - page 259 / 426 » Cutting-Edge Timing Analysis Techniques |
180
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VLSID
2009
IEEE
16 years 7 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
187
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OOPSLA
2001
Springer
15 years 11 months ago
2001
Springer
Regression testing is applied to modified software to provide confidence that the changed parts behave as intended and that the unchanged parts have not been adversely affected ...
207
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RTSS
2005
IEEE
16 years 3 days ago
2005
IEEE
Recently there has been a growing interest in models and methods targeted towards the (co)design of stream processing applications; e.g. those for audio/video processing. Streams ...
181
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RAID
1999
Springer
15 years 10 months ago
1999
Springer
The rapid increase in network bandwidth from mega bits per second to giga bits per second and potentially to tera bits per second, is making it increasingly difficult to carry out...
201
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ICPADS
1994
IEEE
15 years 10 months ago
1994
IEEE
Testingthe performance scalabilityof parallelprograms can be a time consuming task, involving many performance runs for different computer configurations, processor numbers, and p...