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DATE
2008
IEEE
161views Hardware» more  DATE 2008»
16 years 27 days ago
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, fo...
Bao Liu
ICML
2000
IEEE
16 years 7 months ago
Complete Cross-Validation for Nearest Neighbor Classifiers
Cross-validation is an established technique for estimating the accuracy of a classifier and is normally performed either using a number of random test/train partitions of the dat...
Matthew D. Mullin, Rahul Sukthankar
TCAD
2010
98views more  TCAD 2010»
15 years 1 months ago
Statistical Modeling With the PSP MOSFET Model
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...
ICCAD
1999
IEEE
115views Hardware» more  ICCAD 1999»
15 years 10 months ago
Fast performance analysis of bus-based system-on-chip communication architectures
This paper addresses the problem of efficient and accurate performance analysis to drive the exploration and design of bus-based System-on-Chip (SOC) communication architectures. ...
Kanishka Lahiri, Anand Raghunathan, Sujit Dey
CIKM
2006
Springer
15 years 10 months ago
Eigen-trend: trend analysis in the blogosphere based on singular value decompositions
The blogosphere--the totality of blog-related Web sites-has become a great source of trend analysis in areas such as product survey, customer relationship, and marketing. Existing...
Yun Chi, Belle L. Tseng, Jun'ichi Tatemura