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182
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AMFG
2003
IEEE
16 years 4 days ago
2003
IEEE
In this paper, we present a general framework for face modeling under varying lighting conditions. First, we show that a face lighting subspace can be constructed based on three o...
163
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ISCAS
2003
IEEE
16 years 3 days ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
181
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IWSOC
2003
IEEE
16 years 3 days ago
2003
IEEE
— Intellectual property (IP) block reuse is essential for facilitating the design process of System-on-a-Chip. Sharing IP blocks in such a competitive market poses significant h...
189
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VTS
2003
IEEE
16 years 3 days ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
166
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FCT
2003
Springer
16 years 1 days ago
2003
Springer
The closest substring problem, where a short string is sought that minimizes the number of mismatches between it and each of a given set of strings, is a minimization problem with ...