9572 search results - page 178 / 1915 » Cover Algorithms and Their Combination |
157
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CEC
2005
IEEE
16 years 1 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
171
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APCSAC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper discusses the use of signed-digit representations in the implementation of fast and efficient residue-arithmetic units. Improvements to existing signed-digit modulo adde...
166
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ATAL
2003
Springer
15 years 11 months ago
2003
Springer
In our previous research we suggested an approach to maximizing agents preferences over schedules of multiple tasks with temporal and precedence constraints. The proposed approach...
147
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
In this paper, we present an efficient methodology to validate high performance algorithms and prototype them using reconfigurable hardware. We follow a strict topdown Hardware/So...
168
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ICANN
2009
Springer
15 years 11 months ago
2009
Springer
This paper proposes a clustering method SOMAK, which is composed by Self-Organizing Maps (SOM) followed by the Ant K-means (AK) algorithm. The aim of this method is not to find an...