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IOLTS
2005
IEEE
206views Hardware» more  IOLTS 2005»
16 years 7 days ago
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
EDCC
2008
Springer
15 years 8 months ago
Refinement Patterns for Fault Tolerant Systems
The paper puts forward the idea of using fault tolerance refinement patterns to assist system developers in disciplined application of software fault tolerance mechanisms in rigor...
Alexei Iliasov, Alexander Romanovsky
FMCO
2009
Springer
128views Formal Methods» more  FMCO 2009»
15 years 4 months ago
Patterns for Refinement Automation
Formal modelling is indispensable for engineering highly dependable systems. However, a wider acceptance of formal methods is hindered by their insufficient usability and scalabili...
Alexei Iliasov, Elena Troubitsyna, Linas Laibinis,...
CVPR
2008
IEEE
16 years 8 months ago
Constrained spectral clustering through affinity propagation
Pairwise constraints specify whether or not two samples should be in one cluster. Although it has been successful to incorporate them into traditional clustering methods, such as ...
Miguel Á. Carreira-Perpiñán, ...
BMCBI
2008
178views more  BMCBI 2008»
15 years 6 months ago
Identification of coherent patterns in gene expression data using an efficient biclustering algorithm and parallel coordinate vi
Background: The DNA microarray technology allows the measurement of expression levels of thousands of genes under tens/hundreds of different conditions. In microarray data, genes ...
Kin-On Cheng, Ngai-Fong Law, Wan-Chi Siu, Alan Wee...