A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
A common problem in most active contour methods is that the recursive searching scheme can only return a local optimal solution. Furthermore, the internal energy of the snake is n...
In this paper, we present a syntax-directed termination and reduction checker for higher-order logic programs. The reduction checker verifies parametric higher-order subterm orderi...
— Area Under the ROC Curve (AUC) is often used to evaluate ranking performance in binary classification problems. Several researchers have approached AUC optimization by approxi...
This paper presents market-based macroprogramming (MBM), a new paradigm for achieving globally efficient behavior in sensor networks. Rather than programming the individual, low-...