4299 search results - page 205 / 860 » Concurrent Test Generation |
164
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DFT
2004
IEEE
15 years 10 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
129
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ICRA
2006
IEEE
16 years 17 days ago
2006
IEEE
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
141
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ICCHP
2004
Springer
15 years 12 months ago
2004
Springer
This paper gives a brief overview about the partially EU funded project IST-2000-25420 FASTY in the IST program. The objective of FASTY was the creation of a system for increasing ...
167
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GI
2001
Springer
15 years 11 months ago
2001
Springer
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...
157
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COMPSAC
2009
IEEE
15 years 10 months ago
2009
IEEE
Boundary overflows are caused by violation of constraints, mostly limiting the range of internal values of a program, and can be provoked by an intruder to gain control of or acce...