4299 search results - page 183 / 860 » Concurrent Test Generation |
116
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
134
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DATE
2005
IEEE
16 years 3 days ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
178
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PTS
2010
15 years 4 months ago
2010
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
155
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ITC
1995
IEEE
15 years 10 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
209
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SIGMOD
2011
ACM
14 years 9 months ago
2011
ACM
We study the problem of generating synthetic databases having declaratively specified characteristics. This problem is motivated by database system and application testing, data ...