4299 search results - page 173 / 860 » Concurrent Test Generation |
183
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SEW
2006
IEEE
16 years 15 days ago
2006
IEEE
Pseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes adv...
178
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PKC
1999
Springer
15 years 10 months ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
183
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
151
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COMPSAC
2006
IEEE
16 years 16 days ago
2006
IEEE
Web applications have become complex and crucial in many fields. In order to assure their quality, a high demand for systematic methodologies of Web application testing is emergin...
163
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MTDT
2000
IEEE
15 years 11 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...