4299 search results - page 146 / 860 » Concurrent Test Generation |
157
click to vote
DSD
2005
IEEE
16 years 1 days ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
188
click to vote
ECBS
2009
IEEE
16 years 1 months ago
2009
IEEE
Future space missions, such as Mars Science Laboratory, are built upon computing platforms providing a high degree of autonomy and diverse functionality. The increased sophisticat...
172
click to vote
ECRTS
2008
IEEE
16 years 27 days ago
2008
IEEE
Embedded services and applications that interact with the real world often, over time, need to run on different kinds of hardware (low-cost microcontrollers to powerful multicore ...
171
click to vote
ASIAN
2004
Springer
15 years 12 months ago
2004
Springer
A central problem in extending the von Neumann architecture to petaflop computers with millions of hardware threads and with a shared memory is defining the memory model [Lam79,...
176
click to vote
AICCSA
2008
IEEE
16 years 28 days ago
2008
IEEE
Time Petri nets with stopwatches not only model system/environment interactions and time constraints. They further enable modeling of suspend/resume operations in real-time system...