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» Concurrent Test Generation

186

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AMOST
2007
ACM

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Model-based regression test suite generation using dependence analysis

15 years 10 months ago

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Yanping Chen, Robert L. Probert, Hasan Ural

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134

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CASSIS
2004
Springer

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Mastering Test Generation from Smart Card Software Formal Models

15 years 10 months ago

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Fabrice Bouquet, Bruno Legeard, Fabien Peureux, Er...

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154

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COMPSAC
2004
IEEE

138views Software Engineering» more COMPSAC 2004»

Generating Regression Tests via Model Checking

15 years 10 months ago

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Lihua Xu, Marcio S. Dias, Debra J. Richardson

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144

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FMCAD
2006
Springer

144views Formal Methods» more FMCAD 2006»

Automatic Generation of Schedulings for Improving the Test Coverage of Systems-on-a-Chip

15 years 10 months ago

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Claude Helmstetter, Florence Maraninchi, Laurent M...

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139

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ATS
1995
IEEE

91views Hardware» more ATS 1995»

Deterministic test generation for non-classical faults on the gate level

15 years 10 months ago

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