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» Concurrent Test Generation

119

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GLVLSI
1997
IEEE

92views VLSI» more GLVLSI 1997»

On Generating Test Sets that Remain Valid in the Presence of Undetected Faults

15 years 10 months ago

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Irith Pomeranz, Sudhakar M. Reddy

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127

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INFOCOM
1996
IEEE

105views Communications» more INFOCOM 1996»

Context Independent Unique Sequences Generation for Protocol Testing

15 years 10 months ago

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T. Ramalingom, Krishnaiyan Thulasiraman, Anindya D...

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120

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ITC
1996
IEEE

78views Hardware» more ITC 1996»

Identification and Test Generation for Primitive Faults

15 years 10 months ago

Download cadlab.ece.ucsb.edu

Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad...

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151

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ISMVL
1994
IEEE

94views Hardware» more ISMVL 1994»

Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits

15 years 10 months ago

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Elena Dubrova, Dilian Gurov, Jon C. Muzio

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239

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AMOST
2007
ACM

269views Software Engineering» more AMOST 2007»

Test purpose generation in an industrial application

15 years 10 months ago

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