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    ICTAI
    2000
    IEEE
    80views Artificial Intelligence» more  ICTAI 2000»
    A genetic algorithm-based system for generating test programs for microprocessor IP cores
    15 years 10 months ago
    A genetic algorithm-based system for generating test programs for microprocessor IP cores
    Download  dit.upc.es
    Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
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    ISQED
    2000
    IEEE
    77views Hardware» more  ISQED 2000»
    Efficient Hierarchical Approach to Test Generation for Digital Systems
    15 years 10 months ago
    Efficient Hierarchical Approach to Test Generation for Digital Systems
    Download  www.pld.ttu.ee
    Raimund Ubar, Jaan Raik
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    ASPDAC
    2000
    ACM
    102views Hardware» more  ASPDAC 2000»
    Causality based generation of directed test cases
    15 years 10 months ago
    Causality based generation of directed test cases
    Download  www.ninasaxena.com
    Nina Saxena, Jacob A. Abraham, Avijit Saha
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    ARITH
    1999
    IEEE
    100views Applied Computing» more  ARITH 1999»
    Number-Theoretic Test Generation for Directed Rounding
    15 years 10 months ago
    Number-Theoretic Test Generation for Directed Rounding
    Download  hardware.ispras.ru
    Michael Parks
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    ICCAD
    1999
    IEEE
    72views Hardware» more  ICCAD 1999»
    Validation and test generation for oscillatory noise in VLSI interconnects
    15 years 10 months ago
    Validation and test generation for oscillatory noise in VLSI interconnects
    Download  poisson.usc.edu
    : Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
    Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
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