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Concurrent Test Generation
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ICSE
2009
IEEE-ACM
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Software Engineering
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Automated Test Program Generation for an Industrial Optimizing Compiler
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Chen Zhao, Yunzhi Xue, Qiuming Tao, Liang Guo, Zha...
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ICSE
2009
IEEE-ACM
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Software Engineering
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The Automated Generation of Test Cases Using an Extended Domain Based Reliability Model
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Alberto Avritzer, Elaine J. Weyuker
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FM
2001
Springer
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Formal Methods
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Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
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Laurent Arditi, Hédi Boufaïed, Arnaud ...
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IEAAIE
2001
Springer
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Artificial Intelligence
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Goal-Driven, Scalable Generation of Complete Interaction Sequences for Testing Graphical User Interfaces
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adt.et.upb.de
Fevzi Belli
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ATS
2000
IEEE
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Hardware
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An adjacency-based test pattern generator for low power BIST design
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dit.upc.es
Patrick Girard, Loïs Guiller, Christian Landr...
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