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DATE
2003
IEEE
109views Hardware» more  DATE 2003»
15 years 11 months ago
Fully Automatic Test Program Generation for Microprocessor Cores
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
15 years 11 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
DFT
2003
IEEE
81views VLSI» more  DFT 2003»
15 years 11 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
KBSE
2003
IEEE
15 years 11 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...