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Concurrent Test Generation
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SIGSOFT
2001
ACM
125
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Software Engineering
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SIGSOFT 2001
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STG: a tool for generating symbolic test programs and oracles from operational specifications
16 years 7 months ago
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www-valoria.univ-ubs.fr
Duncan Clarke, Elena Zinovieva, Thierry Jér...
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104
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ICCAD
2004
IEEE
99
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Hardware
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ICCAD 2004
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SPIN-TEST: automatic test pattern generation for speed-independent circuits
16 years 3 months ago
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www.eng.yale.edu
Feng Shi, Yiorgos Makris
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127
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ICST
2009
IEEE
104
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Software Engineering
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ICST 2009
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Pruning the Search Space in Path-Based Test Generation
16 years 28 days ago
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sebastien.bardin.free.fr
Sébastien Bardin, Philippe Herrmann
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138
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ISSRE
2008
IEEE
96
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Software Engineering
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ISSRE 2008
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RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
16 years 21 days ago
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www.cs.umd.edu
Ben Breech, Lori L. Pollock, John Cavazos
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117
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KBSE
2008
IEEE
89
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Software Engineering
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KBSE 2008
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Heuristics for Scalable Dynamic Test Generation
16 years 20 days ago
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www.eecs.berkeley.edu
Jacob Burnim, Koushik Sen
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