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ET
2006
120views more  ET 2006»
15 years 6 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
CAV
2010
Springer
179views Hardware» more  CAV 2010»
15 years 10 months ago
Generating Litmus Tests for Contrasting Memory Consistency Models
Well-defined memory consistency models are necessary for writing correct parallel software. Developing and understanding formal specifications of hardware memory models is a chal...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
ALENEX
2001
151views Algorithms» more  ALENEX 2001»
15 years 7 months ago
The Asymmetric Traveling Salesman Problem: Algorithms, Instance Generators, and Tests
The purpose of this paper is to provide a preliminary report on the rst broad-based experimental comparison of modern heuristics for the asymmetric traveling salesmen problem ATSP....
Jill Cirasella, David S. Johnson, Lyle A. McGeoch,...
PDSE
1998
126views more  PDSE 1998»
15 years 7 months ago
Validation and Test Generation for Object-Oriented Distributed Software
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
Thierry Jéron, Jean-Marc Jézé...
CSB
2003
IEEE
15 years 11 months ago
Group Testing With DNA Chips: Generating Designs and Decoding Experiments
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
Alexander Schliep, David C. Torney, Sven Rahmann