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157
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ICIP
2003
IEEE
16 years 8 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
214
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ICIP
2001
IEEE
16 years 8 months ago
2001
IEEE
A common problem in most active contour methods is that the recursive searching scheme can only return a local optimal solution. Furthermore, the internal energy of the snake is n...
174
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CADE
2001
Springer
16 years 7 months ago
2001
Springer
In this paper, we present a syntax-directed termination and reduction checker for higher-order logic programs. The reduction checker verifies parametric higher-order subterm orderi...
158
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IJCNN
2006
IEEE
16 years 25 days ago
2006
IEEE
— Area Under the ROC Curve (AUC) is often used to evaluate ranking performance in binary classification problems. Several researchers have approached AUC optimization by approxi...
177
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COMPSAC
2005
IEEE
16 years 13 days ago
2005
IEEE
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...