5180 search results - page 691 / 1036 » Concurrency, Time, and Constraints |
191
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ICSE
2005
IEEE-ACM
16 years 7 months ago
2005
IEEE-ACM
We present an automatic error-detection approach that combines static checking and concrete test-case generation. Our approach consists of taking the abstract error conditions inf...
175
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PERCOM
2007
ACM
16 years 6 months ago
2007
ACM
Pervasive computing applications are tedious to develop because they combine a number of problems ranging from device heterogeneity, to middleware constraints, to lack of programm...
178
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— The Dynamic Voltage Scaling (DVS) technique is the basis of numerous state-of-the-art energy management schemes proposed for real-time embedded systems. However, recent researc...
163
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STACS
2010
Springer
16 years 1 months ago
2010
Springer
Given a k-uniform hypergraph on n vertices, partitioned in k equal parts such that every hyperedge includes one vertex from each part, the k-Dimensional Matching problem asks wheth...
157
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ATS
2009
IEEE
16 years 1 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...