Current reconfigurable systems suffer from a significant overhead due to the time it takes to reconfigure their hardware. In order to deal with this overhead, and increase the com...
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...
A fully asynchronous implementation of the ARM microprocessor has been developed in order to investigate the potential of asynchronous logic for low-power applications. The work d...
Stephen B. Furber, P. Day, Jim D. Garside, N. C. P...
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
A deadlock-free fully adaptive routing algorithm for 2D meshes which is optimal in the number of virtual channels required and in the number of restrictions placed on the use of t...