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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
16 years 7 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
VLSID
2001
IEEE
144views VLSI» more  VLSID 2001»
16 years 7 months ago
Next Generation Network Processors
Networking hardware manufacturers face the dual demands of supporting ever increasing bandwidth requirements, while also delivering new features, such as the ability to implement ...
Deepak Kataria
HPCA
2008
IEEE
16 years 7 months ago
DeCoR: A Delayed Commit and Rollback mechanism for handling inductive noise in processors
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. Noise-...
Meeta Sharma Gupta, Krishna K. Rangan, Michael D. ...
HPCA
2008
IEEE
16 years 7 months ago
Performance-aware speculation control using wrong path usefulness prediction
Fetch gating mechanisms have been proposed to gate the processor pipeline to reduce the wasted energy consumption due to wrongpath (i.e. mis-speculated) instructions. These scheme...
Chang Joo Lee, Hyesoon Kim, Onur Mutlu, Yale N. Pa...
HPCA
2008
IEEE
16 years 7 months ago
Automated microprocessor stressmark generation
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
Ajay M. Joshi, Lieven Eeckhout, Lizy Kurian John, ...
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